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davidou2a
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Posts: 574
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 Posted: Sun Nov 14, 2010 12:13 pm Post subject: [HARDWARE] Disque dur neuf, qui se fait... vieux ?! [RESOLU] |
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Salut les gars j'ai une interrogation de taille,
J'ai un DD en USB externe de 500Go qui a meme pas 2 semaine et que j'ai du brancher maxi 6 fois a ma machine...
Aujourd'hui voulant y recuperer une image disque je vois que la copie peine, et que carrement la diode du DD s'eteint et... plus rien...
| Code: | TheEvil hellmaker # hdparm -T -t /dev/sdb
/dev/sdb:
Timing cached reads: 1574 MB in 2.00 seconds = 786.68 MB/sec
Timing buffered disk reads: 100 MB in 3.01 seconds = 33.24 MB/sec |
| Code: | TheEvil hellmaker # fsck.ext4 /dev/sdb1e2fsck 1.41.12 (17-May-2010)
/dev/sdb1 : propre, 37/30531584 fichiers, 4101281/122096390 blocs |
| Code: | TheEvil hellmaker # badblocks -v /dev/sdb
Vérification des blocs 0 à 488386583
Vérification des blocs défectueux (test en mode lecture seule) : 0.00% effectué, 0:01 écoulé
.
.
.
.
.
.
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.
130051536ffectué, 3:31:49 écoulé
complété
Passe complétée, 1845 blocs défectueux repérés. |
Vous en pensez quoi? j'ai jamais eu de disque qui a lâché, je les ai toujours changés au bout d'un moment, vous pensez que celui-la est deja cuit? bien que neuf?
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Last edited by davidou2a on Sun Nov 14, 2010 6:55 pm; edited 1 time in total |
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guilc
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davidou2a
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Joined: 15 Dec 2006
Posts: 574
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| Posted: Sun Nov 14, 2010 1:35 pm Post subject: |
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J'avais pas mis de debug smart vu qu'il le prends pas... la poisse quoi :
| Code: | TheEvil hellmaker # smartctl -a -d scsi /dev/sdb
smartctl 5.40 2010-10-16 r3189 [i686-pc-linux-gnu] (local build)
Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net
Device: TOSHIBA MK5059GSX Version:
Serial number: 801130168383
Device type: disk
Local Time is: Sun Nov 14 14:34:16 2010 CET
Device does not support SMART
Error Counter logging not supported
Device does not support Self Test logging |
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guilc
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Joined: 15 Nov 2003
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| Posted: Sun Nov 14, 2010 1:44 pm Post subject: |
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pour un disque over USB -d scsi ne convient pas.
Essaye :
- sans argument
- avec -d sat,16
- avec -d sat,12
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davidou2a
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Joined: 15 Dec 2006
Posts: 574
Location: Ajaccio
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| Posted: Sun Nov 14, 2010 1:56 pm Post subject: |
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Moi qui avait jamais utilisé smartctl 
| Code: | TheEvil hellmaker # smartctl /dev/sdb
smartctl 5.40 2010-10-16 r3189 [i686-pc-linux-gnu] (local build)
Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net
/dev/sdb: Unknown USB bridge [0x18a5:0x022b (0x000)]
Smartctl: please specify device type with the -d option.
Use smartctl -h to get a usage summary |
| Code: | TheEvil hellmaker # smartctl -a -d sat,16 /dev/sdb
smartctl 5.40 2010-10-16 r3189 [i686-pc-linux-gnu] (local build)
Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Device Model: TOSHIBA MK5059GSX
Serial Number: 30A4F7H7S
Firmware Version: GK003U
User Capacity: 500 107 862 016 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Sun Nov 14 14:53:52 2010 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 176) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0
3 Spin_Up_Time 0x0027 100 100 001 Pre-fail Always - 3037
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 34
5 Reallocated_Sector_Ct 0x0033 100 100 050 Pre-fail Always - 2400
7 Seek_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 050 Pre-fail Offline - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 21
10 Spin_Retry_Count 0x0033 100 100 030 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 34
191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 1
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 21
193 Load_Cycle_Count 0x0032 100 100 000 Old_age Always - 156
194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 31 (Min/Max 18/46)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 161
197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 3040
198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 253 000 Old_age Always - 0
220 Disk_Shift 0x0002 100 100 000 Old_age Always - 70
222 Loaded_Hours 0x0032 100 100 000 Old_age Always - 12
223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 0
224 Load_Friction 0x0022 100 100 000 Old_age Always - 0
226 Load-in_Time 0x0026 100 100 000 Old_age Always - 243
240 Head_Flying_Hours 0x0001 100 100 001 Pre-fail Offline - 0
SMART Error Log Version: 1
ATA Error Count: 2357 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 2357 occurred at disk power-on lifetime: 13 hours (0 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 30 f0 db 80 ef Error: UNC 48 sectors at LBA = 0x0f80dbf0 = 260103152
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 80 a0 db 80 e0 00 04:47:04.931 READ DMA EXT
25 00 80 20 db 80 e0 00 04:47:04.929 READ DMA EXT
25 00 80 a0 da 80 e0 00 04:47:04.927 READ DMA EXT
25 00 80 20 da 80 e0 00 04:47:04.926 READ DMA EXT
25 00 80 a0 d9 80 e0 00 04:47:04.924 READ DMA EXT
Error 2356 occurred at disk power-on lifetime: 13 hours (0 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 38 26 80 ef Error: UNC 8 sectors at LBA = 0x0f802638 = 260056632
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 38 26 80 e0 00 04:46:58.891 READ DMA EXT
25 00 08 30 26 80 e0 00 04:46:58.890 READ DMA EXT
25 00 08 28 26 80 e0 00 04:46:58.890 READ DMA EXT
25 00 08 20 26 80 e0 00 04:46:58.889 READ DMA EXT
25 00 08 18 26 80 e0 00 04:46:58.889 READ DMA EXT
Error 2355 occurred at disk power-on lifetime: 13 hours (0 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 58 38 26 80 ef Error: UNC 88 sectors at LBA = 0x0f802638 = 260056632
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 80 10 26 80 e0 00 04:46:54.748 READ DMA EXT
25 00 80 90 25 80 e0 00 04:46:54.746 READ DMA EXT
25 00 80 10 25 80 e0 00 04:46:54.744 READ DMA EXT
25 00 80 90 24 80 e0 00 04:46:54.742 READ DMA EXT
25 00 80 10 24 80 e0 00 04:46:54.740 READ DMA EXT
Error 2354 occurred at disk power-on lifetime: 13 hours (0 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 20 3c c0 ee Error: UNC 8 sectors at LBA = 0x0ec03c20 = 247479328
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 20 3c c0 e0 00 04:43:25.041 READ DMA EXT
ef 03 45 00 00 00 a0 00 04:43:25.040 SET FEATURES [Set transfer mode]
ff ff ff ff ff ff ff 0c 04:43:25.029 [VENDOR SPECIFIC]
25 00 08 20 3c c0 e0 00 04:43:21.041 READ DMA EXT
ef 03 45 00 00 00 a0 00 04:43:21.040 SET FEATURES [Set transfer mode]
Error 2353 occurred at disk power-on lifetime: 13 hours (0 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 20 3c c0 ee Error: UNC 8 sectors at LBA = 0x0ec03c20 = 247479328
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 20 3c c0 e0 00 04:43:21.041 READ DMA EXT
ef 03 45 00 00 00 a0 00 04:43:21.040 SET FEATURES [Set transfer mode]
ff ff ff ff ff ff ff 0c 04:43:21.029 [VENDOR SPECIFIC]
25 00 08 20 3c c0 e0 00 04:43:17.041 READ DMA EXT
ef 03 45 00 00 00 a0 00 04:43:17.039 SET FEATURES [Set transfer mode]
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay. |
| Quote: | Error 2353 occurred at disk power-on lifetime: 13 hours (0 days + 13 hours)
When the command that caused the error occurred, the device was active or idle. |
Ca put ça je pense...
| Code: | TTheEvil hellmaker # smartctl -a -d sat,12 /dev/sdb
smartctl 5.40 2010-10-16 r3189 [i686-pc-linux-gnu] (local build)
Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Device Model: TOSHIBA MK5059GSX
Serial Number: 30A4F7H7S
Firmware Version: GK003U
User Capacity: 500 107 862 016 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Sun Nov 14 15:46:50 2010 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x06) Offline data collection activity
was aborted by the device with a fatal error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 249) Self-test routine in progress...
90% of test remaining.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 176) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0
3 Spin_Up_Time 0x0027 100 100 001 Pre-fail Always - 3037
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 34
5 Reallocated_Sector_Ct 0x0033 100 100 050 Pre-fail Always - 2400
7 Seek_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 050 Pre-fail Offline - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 21
10 Spin_Retry_Count 0x0033 100 100 030 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 34
191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 1
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 21
193 Load_Cycle_Count 0x0032 100 100 000 Old_age Always - 161
194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 44 (Min/Max 18/46)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 161
197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 3120
198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 253 000 Old_age Always - 0
220 Disk_Shift 0x0002 100 100 000 Old_age Always - 70
222 Loaded_Hours 0x0032 100 100 000 Old_age Always - 12
223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 0
224 Load_Friction 0x0022 100 100 000 Old_age Always - 0
226 Load-in_Time 0x0026 100 100 000 Old_age Always - 313
240 Head_Flying_Hours 0x0001 100 100 001 Pre-fail Offline - 0
SMART Error Log Version: 1
ATA Error Count: 2357 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 2357 occurred at disk power-on lifetime: 13 hours (0 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 30 f0 db 80 ef Error: UNC 48 sectors at LBA = 0x0f80dbf0 = 260103152
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 80 a0 db 80 e0 00 04:47:04.931 READ DMA EXT
25 00 80 20 db 80 e0 00 04:47:04.929 READ DMA EXT
25 00 80 a0 da 80 e0 00 04:47:04.927 READ DMA EXT
25 00 80 20 da 80 e0 00 04:47:04.926 READ DMA EXT
25 00 80 a0 d9 80 e0 00 04:47:04.924 READ DMA EXT
Error 2356 occurred at disk power-on lifetime: 13 hours (0 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 38 26 80 ef Error: UNC 8 sectors at LBA = 0x0f802638 = 260056632
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 38 26 80 e0 00 04:46:58.891 READ DMA EXT
25 00 08 30 26 80 e0 00 04:46:58.890 READ DMA EXT
25 00 08 28 26 80 e0 00 04:46:58.890 READ DMA EXT
25 00 08 20 26 80 e0 00 04:46:58.889 READ DMA EXT
25 00 08 18 26 80 e0 00 04:46:58.889 READ DMA EXT
Error 2355 occurred at disk power-on lifetime: 13 hours (0 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 58 38 26 80 ef Error: UNC 88 sectors at LBA = 0x0f802638 = 260056632
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 80 10 26 80 e0 00 04:46:54.748 READ DMA EXT
25 00 80 90 25 80 e0 00 04:46:54.746 READ DMA EXT
25 00 80 10 25 80 e0 00 04:46:54.744 READ DMA EXT
25 00 80 90 24 80 e0 00 04:46:54.742 READ DMA EXT
25 00 80 10 24 80 e0 00 04:46:54.740 READ DMA EXT
Error 2354 occurred at disk power-on lifetime: 13 hours (0 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 20 3c c0 ee Error: UNC 8 sectors at LBA = 0x0ec03c20 = 247479328
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 20 3c c0 e0 00 04:43:25.041 READ DMA EXT
ef 03 45 00 00 00 a0 00 04:43:25.040 SET FEATURES [Set transfer mode]
ff ff ff ff ff ff ff 0c 04:43:25.029 [VENDOR SPECIFIC]
25 00 08 20 3c c0 e0 00 04:43:21.041 READ DMA EXT
ef 03 45 00 00 00 a0 00 04:43:21.040 SET FEATURES [Set transfer mode]
Error 2353 occurred at disk power-on lifetime: 13 hours (0 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 20 3c c0 ee Error: UNC 8 sectors at LBA = 0x0ec03c20 = 247479328
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 20 3c c0 e0 00 04:43:21.041 READ DMA EXT
ef 03 45 00 00 00 a0 00 04:43:21.040 SET FEATURES [Set transfer mode]
ff ff ff ff ff ff ff 0c 04:43:21.029 [VENDOR SPECIFIC]
25 00 08 20 3c c0 e0 00 04:43:17.041 READ DMA EXT
ef 03 45 00 00 00 a0 00 04:43:17.039 SET FEATURES [Set transfer mode]
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Aborted by host 90% 21 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay. |
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guilc
Bodhisattva
Joined: 15 Nov 2003
Posts: 3326
Location: Paris - France
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| Posted: Sun Nov 14, 2010 3:58 pm Post subject: |
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| Code: | 5 Reallocated_Sector_Ct 0x0033 100 100 050 Pre-fail Always - 2400
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 161
197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 3040 |
OK
Ça ça pue...
Le disque a un défaut, ces valeurs ne sont pas du tout normal pour un disque en bon ordre de marche, surtout avec seulement 21h de vol => retour SAV
S'ils demandent pourquoi, ces informations su rapport SMART devraient leur foutre les yeux sur le problème.
Ça veut dire que le firmware du disque a détecté des clusters foirés, et a commencé à les remplacer par la petite FLASH de secours qui sert à ça. Donc que la surface du disque a un gros souci, et que le disque ne va pas survivre longtemps...
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davidou2a
Guru
Joined: 15 Dec 2006
Posts: 574
Location: Ajaccio
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| Posted: Sun Nov 14, 2010 4:08 pm Post subject: |
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Ok, c'est donc bien un defaut
Bon cherchons la garantie du bouzin...
Et bien moi qui avait jamais eu de prob avec Verbatim... C'est un DD 2.5 USB Verbatim (enfin le DD en lui même TOSHIBA) si j'ai bien compris...
Bah merci a toi guilc 
Je vais me pencher sur smartctl j'avais un peu zappé cet outil jusqu'a present mais je vais donc changer ca
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guilc
Bodhisattva
Joined: 15 Nov 2003
Posts: 3326
Location: Paris - France
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| Posted: Sun Nov 14, 2010 4:28 pm Post subject: |
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Oui c'est un DD toshiba dans ton boîtier.
Ce genre de choses arrive, même avec les meilleurs. Si je me souviens bien, en moyenne tous constructeurs confondus on tourne aux environs de 2% de retours SAV au déballage.
SMART c'est bien pratique pour lire ce que le disque dur a à dire sur ses défauts.
Attention, certaines valeurs sont trompeuses parfois. Exemple : les erreurs que tu as dans le log de type "UNC 48 sectors at LBA XXXXX", en l'absence d'autre indicateur, ça peut vouloir dire un défaut de connectique, voire même un défaut de FS, ce genre de souci étant corrigeable (bon, dans ton cas ce n'est pas ça puisque tu as en plus de la réallocation de secteurs indiquant un défaut de surface du disque...)
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davidou2a
Guru
Joined: 15 Dec 2006
Posts: 574
Location: Ajaccio
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| Posted: Sun Nov 14, 2010 5:27 pm Post subject: |
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Oui c'est sur, et surtout avant de me pencher sérieusement sur le problème j'ai testé le DD sous Mac0SX 10.4.11, sous Windows 7 et sous ma Gentoo...
J'ai meme testé plusieurs FS,
- FAT
- NTFS
- EXT 4
- HFS+
Dans tous les cas même problème, donc je pensais à un problème matériel, ce que tu confirmes
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L'enfer je connais, il s'appelle Windows... |
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davidou2a
Guru
Joined: 15 Dec 2006
Posts: 574
Location: Ajaccio
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| Posted: Wed Nov 24, 2010 10:45 am Post subject: |
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Voila la discussion faite avec le support de Verbatim... Vous en pensez quoi sur cette histoire de probleme d'alimentation?
| Quote: | Madame, Monsieur,
Nous vous remercions pour cet e-mail.
Votre numéro de dossier se trouve dans le sujet de cet e-mail.
Veuillez mentionner cette référence lors de toute correspondance avec nos services.
Les disque portable de la gamme Verbatim ont parfois un probleme de sous-alimentation électrique via le port USB.
Ce probleme est résolu en utilisant un cable USB Y (deux prises sur le PC, une sur le disque) pour doubler l’alimentation électrique du disque.
Nous pouvons vous faire parvenir gratuitement un câble USB Y.
Pour cela, merci de nous fournir une adresse postale complète, ainsi que la preuve d'achat du matériel.
Cordiales salutations,
Verbatim Euro Support
Dutec Limited
Company Registered in Ireland No: 307480
-----Original Message-----
From: Info Verbatim <info@Verbatim-europe.com>
Sent: 19/11/2010 14:51:29
To:
Subject: Re: FW: [FRENCH] Demande d'assistance à propos d'un disque dur Store n Go 500Go
From: David XXXXX [mailto:david-xxxx@xxxxx.fr]
Sent: 14 November 2010 16:37
To: Info Verbatim
Subject: [FRENCH] Demande d'assistance à propos d'un disque dur Store n Go 500Go
Bonjour,
Je me permet de vous écrire suite à l'achat d'un disque dur USB Store n' Go de 500Go.
En effet j'ai acheté celui-ci dans le courant du mois d'octobre de cette année, aujourd'hui lors d'une utilisation je me rends compte que une partie des fichiers que j'avais placé sur celui-ci ne sont plus accessibles par erreur d'entrée/sortie... j'ai d'abord pensé à une erreur de système de fichiers, j'ai donc procédé a plusieurs reformatage et le problème est resté inchangé.
REF : CT2104214390
MODEL : 53003 (500GB)
SYNOPSIS :
- Disque reconnu
- Led bleu fonctionne
- Copie/Transferts possibles
- Fonctionne et est reconnu sur :
MacOSX 10.4.11 (Tiger)
Windows 7
GNU/Linux Gentoo
POSSIBILITÉS : Sûrement un défaut de la surface du disque, je vous joint ci-dessous le compte-rendu d'analyse avec les outils SMART sur Linux.
De plus l'analyse avec l'outil "badblocks" reflète une réponse de blocs défectueux...
Passe complétée, 1845 blocs défectueux repérés.
Ce disque dur a grosso-modo une 30aine d'heures d'utilisation.
root@localhost # smartctl -a -d sat,16 /dev/sdb
smartctl 5.40 2010-10-16 r3189 [i686-pc-linux-gnu] (local build)
Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Device Model: TOSHIBA MK5059GSX
Serial Number: 30A4F7H7S
Firmware Version: GK003U
User Capacity: 500 107 862 016 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Sun Nov 14 14:53:52 2010 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 176) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0
3 Spin_Up_Time 0x0027 100 100 001 Pre-fail Always - 3037
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 34
5 Reallocated_Sector_Ct 0x0033 100 100 050 Pre-fail Always - 2400
7 Seek_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 050 Pre-fail Offline - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 21
10 Spin_Retry_Count 0x0033 100 100 030 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 34
191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 1
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 21
193 Load_Cycle_Count 0x0032 100 100 000 Old_age Always - 156
194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 31 (Min/Max 18/46)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 161
197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 3040
198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 253 000 Old_age Always - 0
220 Disk_Shift 0x0002 100 100 000 Old_age Always - 70
222 Loaded_Hours 0x0032 100 100 000 Old_age Always - 12
223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 0
224 Load_Friction 0x0022 100 100 000 Old_age Always - 0
226 Load-in_Time 0x0026 100 100 000 Old_age Always - 243
240 Head_Flying_Hours 0x0001 100 100 001 Pre-fail Offline - 0
SMART Error Log Version: 1
ATA Error Count: 2357 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 2357 occurred at disk power-on lifetime: 13 hours (0 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 30 f0 db 80 ef Error: UNC 48 sectors at LBA = 0x0f80dbf0 = 260103152
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 80 a0 db 80 e0 00 04:47:04.931 READ DMA EXT
25 00 80 20 db 80 e0 00 04:47:04.929 READ DMA EXT
25 00 80 a0 da 80 e0 00 04:47:04.927 READ DMA EXT
25 00 80 20 da 80 e0 00 04:47:04.926 READ DMA EXT
25 00 80 a0 d9 80 e0 00 04:47:04.924 READ DMA EXT
Error 2356 occurred at disk power-on lifetime: 13 hours (0 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 38 26 80 ef Error: UNC 8 sectors at LBA = 0x0f802638 = 260056632
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 38 26 80 e0 00 04:46:58.891 READ DMA EXT
25 00 08 30 26 80 e0 00 04:46:58.890 READ DMA EXT
25 00 08 28 26 80 e0 00 04:46:58.890 READ DMA EXT
25 00 08 20 26 80 e0 00 04:46:58.889 READ DMA EXT
25 00 08 18 26 80 e0 00 04:46:58.889 READ DMA EXT
Error 2355 occurred at disk power-on lifetime: 13 hours (0 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 58 38 26 80 ef Error: UNC 88 sectors at LBA = 0x0f802638 = 260056632
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 80 10 26 80 e0 00 04:46:54.748 READ DMA EXT
25 00 80 90 25 80 e0 00 04:46:54.746 READ DMA EXT
25 00 80 10 25 80 e0 00 04:46:54.744 READ DMA EXT
25 00 80 90 24 80 e0 00 04:46:54.742 READ DMA EXT
25 00 80 10 24 80 e0 00 04:46:54.740 READ DMA EXT
Error 2354 occurred at disk power-on lifetime: 13 hours (0 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 20 3c c0 ee Error: UNC 8 sectors at LBA = 0x0ec03c20 = 247479328
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 20 3c c0 e0 00 04:43:25.041 READ DMA EXT
ef 03 45 00 00 00 a0 00 04:43:25.040 SET FEATURES [Set transfer mode]
ff ff ff ff ff ff ff 0c 04:43:25.029 [VENDOR SPECIFIC]
25 00 08 20 3c c0 e0 00 04:43:21.041 READ DMA EXT
ef 03 45 00 00 00 a0 00 04:43:21.040 SET FEATURES [Set transfer mode]
Error 2353 occurred at disk power-on lifetime: 13 hours (0 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 20 3c c0 ee Error: UNC 8 sectors at LBA = 0x0ec03c20 = 247479328
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 20 3c c0 e0 00 04:43:21.041 READ DMA EXT
ef 03 45 00 00 00 a0 00 04:43:21.040 SET FEATURES [Set transfer mode]
ff ff ff ff ff ff ff 0c 04:43:21.029 [VENDOR SPECIFIC]
25 00 08 20 3c c0 e0 00 04:43:17.041 READ DMA EXT
ef 03 45 00 00 00 a0 00 04:43:17.039 SET FEATURES [Set transfer mode]
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Merci de l'attention que vous apporterez à ma requête, pourriez-vous m'indiquer la procédure pour le remplacement et/ou le dépannage de ce disque?
Cordialement.
________________________________
This email and any files transmitted with it are confidential and
intended solely for the use of the individual or entity to whom they
are addressed.
Verbatim cannot accept liability for statements made which are clearly
the sender's own and not made on behalf of Verbatim. |
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L'enfer je connais, il s'appelle Windows... |
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